Thin Film Characterisation

We have a wide range of equipment to perform Thin Film Characterisation. These include.

Veeco Wyko NT110 Optical Profilometer
The NT1100 provides high resolution 3D surface measurement, from sub-nanometer roughness to millimetre-high steps. With sub-nanometer vertical resolution at all magnifications.
Dektak 6M Stylus Profilometer
The Dektak 6M Bench-Top Surface Profiler measures step heights on any surface, with a programmable stylus force down to one milligram and a Z-height capability up to one millimetre. Its low-inertia sensor delivers extremely accurate step height, surface roughness, and waviness measurements on samples up to six inches.
Filmetrics Reflection Spectrometer
Thickness and optical constants (n and k) of transparent thin films are measured using either reflectance, or transmission spectrum, depending on substrate used. Can also be used to analyse multi layer thin films. quickly and easily with the F20 advanced spectrometry system.

To discuss your specific requirements in detail, please contact Gordon Arnott at SS2i or call us on +44(0)115 848 8665