Transmission Electron Microscopy
JEOL JEM-2010 TEM-Oxford elemental analysis
Our transmission electron microscope uses a standard electron gun or a LaB6 filament. It is capable of standard imaging, diffraction imaging and if fitted with an X-ray analyser so that both crystal structure and composition of samples can be measured when appropriate. We have a cryogenic stage, allowing imaging of structures that are difficult to prepare in a dry state.
Our microscope has been used for materials analysis, crystal structure identification of small particles and investigation of cell structures.
