Scanning Electron Microscopy
JEOL JSM-840A SEM-Oxford elemental analysis
Our scanning electron microscope has a large door, allowing samples up to 10 cm across to be used, but typical samples are smaller than one cm diameter. It is fitted with an X-ray analyser to determine composition and to allow elemental maps to be made. Our instrument has a balance of resolution and speed, making it suitable for the broadest possible range of applications.
We have used it for a huge range of purposes, from investigating biological samples, such as the structures on spiders' legs, looking at gunshot residue for forensic research, analysis of corrosion products and testing microfabrication techniques.
